32nd IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2025) returns to Penang as Asia’s leading symposium on failure analysis, reliability, and specialized technologies in integrated circuits. This four-day event gathers global experts, researchers, and professionals to share insights on cutting-edge techniques in fault isolation, transistor reliability, hardware security, and AI-driven diagnostics. Attendees can expect a dynamic program featuring keynotes, tutorials, workshops, poster sessions, and the visually engaging “Art of FA” contest. With a strong focus on innovation and collaboration, IPFA 2025 offers a platform for knowledge exchange, networking, and showcasing the latest advancements in semiconductor reliability.
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